Analysis of Single-Event Upsets in Phase-Locked Loops

Manish N Patil

Abstract


Exploration of space provides us with useful
information about the universe. Understanding the number of
issues and solving them lead to progress in this field. The sun is
major source of radiation, thus the radiation experienced by the
space-craft in the outer space is one of the issue. The electronic
circuitry on-board the space-crafts are exposed to these
radiations and may result in reduction of the lifetime of the
space-crafts and even cause failure. Thus for successful and safe
exploration of space it is necessary to analyze and understand the effects of radiation on any electronics circuitry. One of the main integral parts of many electronic systems is a phase-locked
loop(PLL) which is widely used in commercial and spacedeployed
electronic system to reduce phase delay associated with
distribution of clock signal. Single event upsets (SEUs) have been a growing concern in modern integrated circuits (ICs) where
increased susceptibilities to SEUs have been reported as device
feature sizes decrease and operating frequencies increase [1].
Thus analyzing the effects of single event transients (SET) in PLL
is important for all these applications. This paper summarizes
effects of radiation on different blocks in PLL

Keywords


Phase-locked loop; Single event effect; Single event transien; Single event upset

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